The DS-SA60 model is a specialized machine designed to compare the chip material's scanned MAP image with the loaded MAP file, and then sort chips with the same BIN number onto the same wafer. The machine sorts chips based on the optoelectronic parameters obtained from the chip tester and the product appearance inspection results from the AOI system. It is widely used in sorting LED chips, IC chips, optical filters, lenses, SM components, capacitors, and other materials.